Ключевые слова: HTS, YBCO, films, PLD process, pinning centers artificial, comparison, resistive transition, magnetic field dependence, vortex dynamics, critical caracteristics, critical current density, angular dependence, temperature dependence, susceptibility, frequency dependence, Jc/B curves, magnetization curves, relaxation, experimental results
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Mos R.B., Pinto V., Piperno L., Petrisor JrT.
Ключевые слова: HTS, YBCO, films, template layers, substrate SrTiO3, nanoscaled effects, microstructure, critical caracteristics, critical current density, fabrication, MOD process, surface, pinning centers artificial, X-ray diffraction, Jc/B curves, angular dependence, pinning force, lattice parameter, magnetic field dependence, experimental results
Ключевые слова: HTS, REBCO, thin films, coated conductors, nanoscaled effects, pinning centers artificial, YBCO, GdBCO, review, critical current, composition
Vannozzi A., Celentano G., Rizzo F., Armenio A.A., Meledin A., Pinto V., Masi A., Orlanducci S., Santoni A., Ferrarese F.M.
Ключевые слова: HTS, YBCO, films epitaxial, GdBCO, YGdBCO, fabrication, chemical solution deposition, MOD process, substrate SrTiO3, pinning centers artificial, lattice parameter, X-ray diffraction, grain size, composition, microstructure, critical caracteristics, Jc/B curves, critical temperature, irreversibility fields, temperature dependence, critical current density, angular dependence, experimental results
Ключевые слова: doping, pinning centers artificial, nanoscaled effects, X-ray diffraction, microstructure, HTS, YBCO, bulk, single-domain, composites, fabrication
Wang H., Haugan T., Chen S., Huang J., Wu J., Sebastian M.A., Baca J., Gautam B., Xing Z., Osofsky M., Prestigiacomo J., Mishra S.
Ключевые слова: HTS, YBCO, bulk, pinning centers artificial, graphene, nanoscaled effects, X-ray diffraction, lattice parameter, microstructure, resistivity, temperature dependence, critical temperature, composition, critical caracteristics, current-voltage characteristics, critical current density, experimental results, substitution
Ключевые слова: LTS, Nb3Sn, wires multifilamentary, pinning centers artificial, upper critical fields, Jc/B curves, RRP process
Ключевые слова: thin films, substrate SrTiO3, PLD process, pinning, pinning centers artificial, angular dependence, defects columnar, size effect, nanoscaled effects, vortex dynamics, lattice parameter, critical temperature, critical caracteristics, critical current density, Jc/B curves, pinning force, experimental results, HTS, YBCO
Wang H., Haugan T., Huang J., Wu J., Sebastian M.A., Baca J., Gautam B., Osofsky M., Prestigiacomo J., Misra S., Ogunjimi V.
Ключевые слова: HTS, YBCO, nanocomposites, thin films, PLD process, substrate SrTiO3, pinning centers artificial, nanoscaled effects, interfaces, dislocations, X-ray diffraction, lattice parameter, pinning force, critical temperature, microstructure, critical caracteristics, Jc/B curves, critical current density, angular dependence, experimental results
Iijima Y., Awaji S., Kiss T., Kakimoto K., Fujita S., Yoshida T., Daibo M., Okada T., Muto S., Hirata W.
Ключевые слова: HTS, EuBCO, coated conductor modules, fabrication, PLD process, IBAD process, pinning, doping effect, pinning centers artificial, growth rate, critical caracteristics, critical current distribution, microstructure, Jc/B curves, pinning force, critical current density, angular dependence, critical current, magnetic field dependence, experimental results
Ключевые слова: HTS, YBCO, Hastelloy, buffer layers, fabrication, coated conductors, IBAD process, pinning centers artificial, nanodots, doping effect, nanoscaled effects, pinning, dislocations, X-ray diffraction, lattice parameter, magnetization, critical caracteristics, Jc/B curves, composition, critical current density, angular dependence, experimental results
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Jr., Rizzo F., Augieri A., Marzi G.D., Armenio A.A., Sotgiu G., Mos R.B., Pinto V., Piperno L., Petrisor T. J., Celentano a.G.
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